Computer simulation of electron microscope diffraction and images : Proceeding of a topical symposium on Computer Simulation of Electron Microscope Diffraction and Images

Author: sponsored by the ASM/MSD Computer Simulation Committee, held at the TMS Annual Meeting in Las Vegas, Nevada, February 28 - March 3, 1989 ; edited by William Krakow, Michael O'Keefe

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Material Type: 図書
ISBN: 0873391098
Title: Computer simulation of electron microscope diffraction and images : Proceeding of a topical symposium on Computer Simulation of Electron Microscope Diffraction and Images
Author/Editor: sponsored by the ASM/MSD Computer Simulation Committee, held at the TMS Annual Meeting in Las Vegas, Nevada, February 28 - March 3, 1989 ; edited by William Krakow, Michael O'Keefe
Author Heading: Krakow, William
https://ci.nii.ac.jp/author/DA00572729
O'Keefe, Michael (Michael A.)
ASM/MSD Computer Simulation Committee
Minerals, Metals and Materials Society. Meeting
Publication, Distribution, etc.: Minerals, Metals and Materials Society
Publication Date: c1989
Publication Date (W3CDTF): 1989
Size: 24 cm
Place of Publication (Country Code): us
Target Audience: 一般
Related Material (URI): https://ci.nii.ac.jp/ncid/BA10875298#entity
https://lccn.loc.gov/89061030
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA10875298 : BA10875298
LC Control Number: 89061030
https://lccn.loc.gov/89061030