Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA

Author: Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]

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Material Type: 図書
ISBN: 0819445479
Title: Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA
Author/Editor: Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]
Author Heading: Society of Photo-optical Instrumentation Engineers
https://ci.nii.ac.jp/author/DA00848546
Gu, Zu-Han
https://ci.nii.ac.jp/author/DA12468939
Maradudin, A. A.
https://ci.nii.ac.jp/author/DA00038783
Publication, Distribution, etc.: SPIE
Publication Date: c2002
Publication Date (W3CDTF): 2002
Size: 28 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes index
Related Material: Proceedings
https://cir.nii.ac.jp/crid/1130282269217551104
Related Material (URI): https://ci.nii.ac.jp/ncid/BA6196980X#entity
Periodical Title: Proceedings
https://cir.nii.ac.jp/crid/1130282269217551104
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA6196980X : BA6196980X