Proceedings, 1997 IEEE International Conference on Microelectronic Systems Education, MSE'97 : doing more with less in a rapidly changing environment, July 21-23, 1997, Arlington, Virginia, USA

Material type: 図書

Author: sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research Corporation

Publisher: IEEE Computer Society Press

Publication date: c1997

Material Format: Paper

Capacity, size, etc.: 28 cm

NDC: -

View All

Notes on use

Note (General)：: "IEEE Computer Society order number PR07996"--T.p. verso"IEEE Order Plan catalog number 97TB100127"--T.p. versoIncludes bibliographical references and...

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 0818679964
Title: Proceedings, 1997 IEEE International Conference on Microelectronic Systems Education, MSE'97 : doing more with less in a rapidly changing environment, July 21-23, 1997, Arlington, Virginia, USA
Author/Editor: sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research Corporation
Author Heading: IEEE International Conference on Microelectronic Systems Education
IEEE Computer Society. Design Automation Technical Committee
https://ci.nii.ac.jp/author/DA03047306
IEEE Computer Society. Test Technology Committee
https://ci.nii.ac.jp/author/DA0264481X
IEEE Computer Society. Technical Committee on VLSI
https://ci.nii.ac.jp/author/DA04967445
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: c1997
Publication Date (W3CDTF): 1997
Size: 28 cm
Alternative Title: 97TB100127
Doing more with less in a rapidly changing environment
Microelectronic Systems Education
MSE '97
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Microelectronics -- Study and teaching -- Congresses
Computer science -- Study and teaching -- Congresses
LCC: TK7874
Target Audience: 一般
Note (General): "IEEE Computer Society order number PR07996"--T.p. verso
"IEEE Order Plan catalog number 97TB100127"--T.p. verso
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA42938467#entity
https://lccn.loc.gov/97070930
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA42938467 : BA42938467
LC Control Number: 97070930
https://lccn.loc.gov/97070930