Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

Material type: 図書

Author: edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions

Publisher: The Electrochemical Society

Publication date: c1994

Material Format: Paper

Capacity, size, etc.: 23 cm

NDC: -

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Note (General)：: Includes bibliographies and index"held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, LA"

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Paper

Material Type: 図書
ISBN: 1566770378
Title: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects
Author/Editor: edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions
Author Heading: Queisser, Hans J.
https://ci.nii.ac.jp/author/DA02682896
Electrochemical Society. Electronics Division
https://ci.nii.ac.jp/author/DA0357072X
Electrochemical Society. Dielectric Science and Technology Division
https://ci.nii.ac.jp/author/DA06421624
Publication, Distribution, etc.: The Electrochemical Society
Publication Date: c1994
Publication Date (W3CDTF): 1994
Size: 23 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes bibliographies and index
"held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, LA"
Related Material: Proceedings
https://cir.nii.ac.jp/crid/1130282269273401728
Related Material (URI): https://ci.nii.ac.jp/ncid/BA23030106#entity
https://lccn.loc.gov/93072866
Periodical Title: Proceedings
https://cir.nii.ac.jp/crid/1130282269273401728
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA23030106 : BA23030106
LC Control Number: 93072866
https://lccn.loc.gov/93072866