Made in USA : arte americano de la Phillips Collection : Fundación Mapfre : TF. Editores

Made in USA : arte americano de la Phillips Collection : Fundación Mapfre

Material type: 図書

Author: dirección, Susan Behrends Frank

Publisher: Fundación Mapfre : TF. Editores

Publication date: c2010

Material Format: Paper

Capacity, size, etc.: 31 cm

NDC: -

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Notes on use

Note (General)：: Catalogue of an exhibition held at Fundación Mapfre, Madrid, Oct. 6, 2010-Jan. 16, 2011Exhibitors: Edward Hicks, Arthur B. Davies, George Inness ... [...

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Paper

Material Type: 図書
ISBN: 9788498442427
9788492441266
Title: Made in USA : arte americano de la Phillips Collection
Volume: : Fundación Mapfre
: TF. Editores
Author/Editor: dirección, Susan Behrends Frank
Author Heading: Frank, Susan Behrends
https://ci.nii.ac.jp/author/DA11102658
Hicks, Edward
https://ci.nii.ac.jp/author/DA08970328
Davies, Arthur B. (Arthur Bowen)
https://ci.nii.ac.jp/author/DA12582446
Inness, George
https://ci.nii.ac.jp/author/DA15237455
Phillips Collection
https://ci.nii.ac.jp/author/DA0442290X
Fundación Mapfre
https://ci.nii.ac.jp/author/DA10067369
Publication, Distribution, etc.: Fundación Mapfre : TF. Editores
Publication Date: c2010
Publication Date (W3CDTF): 2010
Size: 31 cm
Place of Publication (Country Code): sp
Text Language Code: es
Subject Heading: 展覧会カタログ
Hicks, Edward, 1780-1849
Davies, Arthur B. (Arthur Bowen), 1862-1928
Inness, George, 1825-1894
Painting, American -- Exhibitions
Phillips Collection -- Exhibitions
UDC: 7.036(7)
LCC: ND205
Target Audience: 一般
Note (General): Catalogue of an exhibition held at Fundación Mapfre, Madrid, Oct. 6, 2010-Jan. 16, 2011
Exhibitors: Edward Hicks, Arthur B. Davies, George Inness ... [et al.]
"Exposición organizada por la Phillips Collection de Washington DC y Fundación Mapfre."--Colophon
Bibliography: p. 221-225
Related Material (URI): https://ci.nii.ac.jp/ncid/BB07433539#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB07433539 : BB07433539