Annual Reliability and Maintainability Symposium, 2010 proceedings : the International Symposium on Product Quality and Integrity, San Jose, CA, USA, 2010 January 25-28

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Note (General)：: "IEEE catalog number: CFP10RAM-PRT"Includes bibliographies and indexes

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Material Type: 図書
ISBN: 9781424451029
Title: Annual Reliability and Maintainability Symposium, 2010 proceedings : the International Symposium on Product Quality and Integrity, San Jose, CA, USA, 2010 January 25-28
Author Heading: Reliability and Maintainability Symposium
https://ci.nii.ac.jp/author/DA01815564
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c2010
Publication Date (W3CDTF): 2010
Size: 27 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog number: CFP10RAM-PRT"
Includes bibliographies and indexes
Related Material (URI): https://ci.nii.ac.jp/ncid/BB04561350#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB04561350 : BB04561350