Proceedings : 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 23-25, 1998, Santa Barbara, California : paper : case.

Proceedings : 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 23-25, 1998, Santa Barbara, California : paper

Material type: 図書

Author: sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence

Publisher: IEEE Computer Society Press

Publication date: c1998

Material Format: Paper

Capacity, size, etc.: 28 cm

NDC: -

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Notes on use

Note (General)：: Includes bibliographies and index"IEEE catalog number 98CB36231"--T.p. verso"IEEE Computer Society Press order number PR08497"--T.p. verso

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Paper

Material Type: 図書
ISBN: 0818684976
0780350634
Title: Proceedings : 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 23-25, 1998, Santa Barbara, California
Volume: : paper
: case.
Author/Editor: sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence
Author Heading: IEEE Computer Society Conference on Computer Vision and Pattern Recognition
https://ci.nii.ac.jp/author/DA00923175
IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
https://ci.nii.ac.jp/author/DA02226387
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: c1998
Publication Date (W3CDTF): 1998
Size: 28 cm
Alternative Title: Proceedings : CVPR '98
98CB36231
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Computer vision -- Congresses
Pattern recognition systems -- Congresses
LCC: TA1632
Target Audience: 一般
Note (General): Includes bibliographies and index
"IEEE catalog number 98CB36231"--T.p. verso
"IEEE Computer Society Press order number PR08497"--T.p. verso
Related Material (URI): https://ci.nii.ac.jp/ncid/BA3663227X#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA3663227X : BA3663227X