Annual Reliability and Maintainability Symposium : 2001 proceedings : Philadelphia, Pennsylvania USA, 2001 January 22-25 : soft. : microfiche

Annual Reliability and Maintainability Symposium : 2001 proceedings : Philadelphia, Pennsylvania USA, 2001 January 22-25 : soft.

Notes on use

Note (General)：: Includes bibliographical references and index"IEEE catalog number: 01CH37179" -- T. p. verso"The International Symposium on Product Quality & Integrit...

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Material Type: 図書
ISBN: 0780366158
0780366166
Title: Annual Reliability and Maintainability Symposium : 2001 proceedings : Philadelphia, Pennsylvania USA, 2001 January 22-25
Volume: : soft.
: microfiche
Author Heading: Reliability and Maintainability Symposium
https://ci.nii.ac.jp/author/DA01815564
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c2001
Publication Date (W3CDTF): 2001
Size: 28 cm
Alternative Title: 01CH37179
Place of Publication (Country Code): us
Text Language Code: en
NDC 8th ed.: 509.8
Target Audience: 一般
Note (General): Includes bibliographical references and index
"IEEE catalog number: 01CH37179" -- T. p. verso
"The International Symposium on Product Quality & Integrity"
Related Material (URI): https://ci.nii.ac.jp/ncid/BA51695490#entity
https://lccn.loc.gov/78132873
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA51695490 : BA51695490
LC Control Number: 78132873
https://lccn.loc.gov/78132873