ATFA-77 : advanced techniques in failure analysis : 27-29 September 1977 : Airport Marriott Hotel, Los Angeles, California USA : proceedings

Material type: 図書

Author: sponsored by Institute of Electrical and Electronics Engineers ... [et al.]

Publisher: Institute of Electrical and Electronics Engineers

Publication date: c1977

Material Format: Paper

Capacity, size, etc.: 29 cm

NDC: -

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Notes on use

Note (General)：: Includes bibliographical references and index"IEEE Catalog No. 77CH1248-4REG6"

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Paper

Material Type: 図書
Title: ATFA-77 : advanced techniques in failure analysis : 27-29 September 1977 : Airport Marriott Hotel, Los Angeles, California USA : proceedings
Author/Editor: sponsored by Institute of Electrical and Electronics Engineers ... [et al.]
Author Heading: Advanced Techniques in Failure Analysis Symposium (AFTA)
Institute of Electrical and Electronics Engineers
https://ci.nii.ac.jp/author/DA00739948
Institute of Electrical and Electronics Engineers. Los Angeles Council
https://ci.nii.ac.jp/author/DA02617023
International Metallographic Society
https://ci.nii.ac.jp/author/DA00654131
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c1977
Publication Date (W3CDTF): 1977
Size: 29 cm
Alternative Title: AFTA-77 : advanced techniques in failure analysis
AFTA-77
77CH1248-4 REG6
77CH12484
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Electronic apparatus and appliances -- Testing -- Congresses
Semiconductors -- Testing -- Congresses
LCC: TK7870
Target Audience: 一般
Note (General): Includes bibliographical references and index
"IEEE Catalog No. 77CH1248-4REG6"
Related Material (URI): https://ci.nii.ac.jp/ncid/BC02332393#entity
https://lccn.loc.gov/78111833
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BC02332393 : BC02332393
LC Control Number: 78111833
https://lccn.loc.gov/78111833