X-ray diffraction imaging : technology and applications : hardback

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Material Type: 図書
ISBN: 9781498783613
Title: X-ray diffraction imaging : technology and applications
Volume: : hardback
Author/Editor: edited by Joel Greenberg ; managing editor, Krzysztof Iniewski
Author Heading: Greenberg, Joel (Joel Alter)
Iniewski, Krzysztof
Publication, Distribution, etc.: CRC Press, Taylor & Francis
Publication Date: c2019
Publication Date (W3CDTF): 2019
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: X-ray diffraction imaging
Radiography, Industrial
Detectors -- Equipment and supplies
Refractometers
LCC: TA417.25
Target Audience: 一般
Note (General): Includes bibliographical references and index
Related Material: Devices, circuits, and systems
https://cir.nii.ac.jp/crid/1130000794715452928
Related Material (URI): https://ci.nii.ac.jp/ncid/BC13374351#entity
Periodical Title: Devices, circuits, and systems
https://cir.nii.ac.jp/crid/1130000794715452928
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BC13374351 : BC13374351