図書

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

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Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

Material type
図書
Author
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
Publisher
IEEE Computer Society
Publication date
c2004
Material Format
Paper
Capacity, size, etc.
28 cm
NDC
-
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Notes on use

Note (General):

"IEEE Computer Society Order Number P2193"--T.p. versoWorkshop number from Web siteIncludes bibliographical references and author index

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Paper

Material Type
図書
ISBN
0769521932
Author/Editor
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
Publication, Distribution, etc.
Publication Date
c2004
Publication Date (W3CDTF)
2004
Size
28 cm
Alternative Title
Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing