Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

Material type: 図書

Author: edited by T. Ogawa

Publisher: North-Holland

Publication date: 1990

Material Format: Paper

Capacity, size, etc.: 26 cm

NDC: -

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Journal of crystal growth

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Paper

Material Type: 図書
Title: Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989
Author/Editor: edited by T. Ogawa
Author Heading: International Symposium on Defect Recognition and Image Processing in III-V Compounds
https://ci.nii.ac.jp/author/DA00450856
Ogawa, T.
Publication, Distribution, etc.: North-Holland
Publication Date: 1990
Publication Date (W3CDTF): 1990
Size: 26 cm
Place of Publication (Country Code): ne
Text Language Code: en
Subject Heading: Semiconductors -- Defects -- Congresses
Gallium arsenide -- Congresses
Image processing -- Congresses
LCC: TK7871.85
Target Audience: 一般
Related Material: Journal of crystal growth
https://cir.nii.ac.jp/crid/1130000796829032576
Related Material (URI): https://ci.nii.ac.jp/ncid/BA10947898#entity
Periodical Title: Journal of crystal growth
https://cir.nii.ac.jp/crid/1130000796829032576
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA10947898 : BA10947898