Analytical electron microscopy 1987 : proceedings of a workshop held at Kona, Hawaii, 13-17 July 1987

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Note (General)：: Sponsored by Microbeam Analysis Society in association with the Japanese Society for the Promotion of Science, Australian Microbeam Analysis Society

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Material Type: 図書
Title: Analytical electron microscopy 1987 : proceedings of a workshop held at Kona, Hawaii, 13-17 July 1987
Author/Editor: D.C. Joy, editor
Author Heading: Joy, David C.
https://ci.nii.ac.jp/author/DA01136336
Microbeam Analysis Society. Conference
https://ci.nii.ac.jp/author/DA03915683
Publication, Distribution, etc.: San Francisco Press
Publication Date: 1987
Publication Date (W3CDTF): 1987
Size: 29 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Sponsored by Microbeam Analysis Society in association with the Japanese Society for the Promotion of Science, Australian Microbeam Analysis Society
Related Material (URI): https://ci.nii.ac.jp/ncid/BA80706342#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA80706342 : BA80706342