Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, proceedings

Material type: 図書

Author: ed. Dit-Yan Yeung, James T. Kwok, Ana Fred ...[et al.]

Publisher: Springer

Publication date: 2006

Material Format: Paper

Capacity, size, etc.: 24 cm

NDC: -

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Note (General)：: "S+SSPR 2006, IAPR"Includes bibliographical reference and index

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Lecture notes in computer science

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Paper

Material Type: 図書
ISBN: 3540372369
Title: Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, proceedings
Author/Editor: ed. Dit-Yan Yeung, James T. Kwok, Ana Fred ...[et al.]
Author Heading: Yeung, Dit-Yan
Kwok, James T.
Fred, Ana
Roli, Fabio
https://ci.nii.ac.jp/author/DA13175299
Ridder, Dick de
International Association for Pattern Recognition
https://ci.nii.ac.jp/author/DA00847452
International Workshop on Structural and Syntactic Pattern Recognition
https://ci.nii.ac.jp/author/DA07393681
International Workshop on Statistical Techniques in Pattern Recognition
https://ci.nii.ac.jp/author/DA12783506
Publication, Distribution, etc.: Springer
Publication Date: 2006
Publication Date (W3CDTF): 2006
Size: 24 cm
Place of Publication (Country Code): gw
Text Language Code: en
Target Audience: 一般
Note (General): "S+SSPR 2006, IAPR"
Includes bibliographical reference and index
Related Material: Lecture notes in computer science
https://cir.nii.ac.jp/crid/1130282272706176768
Related Material (URI): https://ci.nii.ac.jp/ncid/BA7820491X#entity
https://lccn.loc.gov/2006930416
Periodical Title: Lecture notes in computer science
https://cir.nii.ac.jp/crid/1130282272706176768
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA7820491X : BA7820491X
LC Control Number: 2006930416
https://lccn.loc.gov/2006930416