Ninteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 11-13, 2003 : SEMI-THRM Proceedings 2003

Author: [sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST

Notes on use

Note (General)：: Title from cover"IEEE catalog number 02CH37437" -- T.p. versoSymposium held at: Fiarmont Hotel, San Jose, CA, USA

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Material Type: 図書
ISBN: 0780377931
Title: Ninteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 11-13, 2003 : SEMI-THRM Proceedings 2003
Author/Editor: [sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST
Author Heading: IEEE Semiconductor Thermal Measurement and Management Symposium
https://ci.nii.ac.jp/author/DA10189581
Institute of Electrical and Electronics Engineers
https://ci.nii.ac.jp/author/DA00739948
Components, Packaging & Manufacturing Technology Society
https://ci.nii.ac.jp/author/DA08354018
United States. National Institute of Standards and Technology
https://ci.nii.ac.jp/author/DA02985311
Publication, Distribution, etc.: IEEE Service Center
Publication Date: c2003
Publication Date (W3CDTF): 2003
Size: 28 cm
Alternative Title: 02CH37437
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Title from cover
"IEEE catalog number 02CH37437" -- T.p. verso
Symposium held at: Fiarmont Hotel, San Jose, CA, USA
Related Material (URI): https://ci.nii.ac.jp/ncid/BA65904158#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA65904158 : BA65904158