Annual Reliability and Maintainability Symposium, 2008 proceedings : the International Symposium on Product Quality and Integrity, Las Vegas, Nevada, USA on January 28-31, 2008

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Material Type: 電子資料
ISBN: 142441461X
Title: Annual Reliability and Maintainability Symposium, 2008 proceedings : the International Symposium on Product Quality and Integrity, Las Vegas, Nevada, USA on January 28-31, 2008
Author Heading: Reliability and Maintainability Symposium
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c2008
Publication Date (W3CDTF): 2008
Size: 12 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): "IEEE catalog number: 08CH37927C"--T. p. verso
Related Material (URI): https://ci.nii.ac.jp/ncid/BA87193756#entity
https://lccn.loc.gov/78132873
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA87193756 : BA87193756
LC Control Number: 78132873
https://lccn.loc.gov/78132873