新開発半導体検出器を用いたプラズマ閉じ込め電位のX線測定に基づく新計測法の開発

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Material Type: 図書
Title: 新開発半導体検出器を用いたプラズマ閉じ込め電位のX線測定に基づく新計測法の開発
Title Transcription: シンカイハツハンドウタイケンシュツキオモチイタプラズマトジコメデンイノ Xセンソクテイニモトズクシンケイソクホウノカイハツ
Author/Editor: 長照二研究代表者
Author Heading: 長, 照二チョウ, テルジ
https://ci.nii.ac.jp/author/DA09927619
Publication, Distribution, etc.: [長照二]
Publication Date: 1996.3
Publication Date (W3CDTF): 1996
Size: 30cm
Place of Publication (Country Code): ja
Target Audience: 一般
Note (General): 平成6-7年度科学研究費補助金(一般研究(B))研究成果報告書
研究課題番号: 06452418
英文併載
Related Material (URI): https://ci.nii.ac.jp/ncid/BN15244252#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BN15244252 : BN15244252