Current issues in the analysis of Semitic grammar and lexicon 1 2

Current issues in the analysis of Semitic grammar and lexicon 1

Notes on use

Note (General)：: 1. Oslo-Göteborg cooperation 3rd-5th June 2004 -- 2. Oslo-Göteborg cooperation 4th-5th November 2005Includes bibliographical references

Related materials as well as pre- and post-revision versions

Search by Bookstore

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 3447052686
9783447054416
Title: Current issues in the analysis of Semitic grammar and lexicon
Volume: 1
2
Author/Editor: edited by Lutz Edzard and Jan Retsö
Author Heading: Edzard, Lutz
https://ci.nii.ac.jp/author/DA11720533
Retsö, Jan
https://ci.nii.ac.jp/author/DA04038366
Publication, Distribution, etc.: Harrassowitz
Publication Date: 2005-
Publication Date (W3CDTF): 2005
Size: 22 cm
Place of Publication (Country Code): gw
Text Language Code: en
Target Audience: 一般
Note (General): 1. Oslo-Göteborg cooperation 3rd-5th June 2004 -- 2. Oslo-Göteborg cooperation 4th-5th November 2005
Includes bibliographical references
Related Material: Abhandlungen für die Kunde des Morgenlandes
https://cir.nii.ac.jp/crid/1130282269196303616
Related Material (URI): https://ci.nii.ac.jp/ncid/BA78687052#entity
Periodical Title: Abhandlungen für die Kunde des Morgenlandes
https://cir.nii.ac.jp/crid/1130282269196303616
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA78687052 : BA78687052