CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

Material type: 図書

Author: editors: Alexander A. Demkov ... [et al.]

Publisher: Materials Research Society

Publication date: c2009

Material Format: Paper

Capacity, size, etc.: 24 cm

NDC: -

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Notes on use

Note (General)：: Other editors: Bill Taylor, H. Rusty Harris, Jeffery W. Butterbaugh, Willy RachmadyIncludes bibliographical references and indexes"..., 'CMOS gate-sta...

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Paper

Material Type: 図書
ISBN: 9781605111285
Title: CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A.
Author/Editor: editors: Alexander A. Demkov ... [et al.]
Author Heading: Demkov, Alexander A.
Taylor, Bill
Harris, H. Rusty
Butterbaugh, Jeffery W.
Rachmady, Willy
Materials Research Society. Spring Meeting
https://ci.nii.ac.jp/author/DA02961732
Publication, Distribution, etc.: Materials Research Society
Publication Date: c2009
Publication Date (W3CDTF): 2009
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Other editors: Bill Taylor, H. Rusty Harris, Jeffery W. Butterbaugh, Willy Rachmady
Includes bibliographical references and indexes
"..., 'CMOS gate-stack scaling--materials, interfaces and reliability implications,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California."--Pref.
Related Material: Materials Research Society symposium proceedings
https://cir.nii.ac.jp/crid/1130282268858574848
Related Material (URI): https://ci.nii.ac.jp/ncid/BB02098415#entity
Periodical Title: Materials Research Society symposium proceedings
https://cir.nii.ac.jp/crid/1130282268858574848
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB02098415 : BB02098415