JTAGテストの基礎と応用 : 新時代の電子回路基板のテスト手法とさまざまな応用事例

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Material Type: 図書
ISBN: 4789836827
Title: JTAGテストの基礎と応用 : 新時代の電子回路基板のテスト手法とさまざまな応用事例
Title Transcription: JTAG テストノキソトオウヨウ : シンジダイノデンシカイロキバンノテストシュホウトサマザマナオウヨウジレイ
Author/Editor: 坂巻佳壽美著
Author Heading: 坂巻, 佳寿美サカマキ, カズミ
https://ci.nii.ac.jp/author/DA01643072
Publication, Distribution, etc.: CQ出版
Publication Date: 1998.12
Publication Date (W3CDTF): 1998
Size: 21cm
Place of Publication (Country Code): ja
Text Language Code: ja
Subject Heading: 集積回路
NDC 8th ed.: 549.7
NDC 9th ed.: 549.7 : Electronic engineering
Target Audience: 一般
Note (General): 参考文献: p180
Related Material: I/F essence
https://cir.nii.ac.jp/crid/1130282270622100608
Related Material (URI): https://ci.nii.ac.jp/ncid/BA39259718#entity
Periodical Title: I/F essence
https://cir.nii.ac.jp/crid/1130282270622100608
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA39259718 : BA39259718