Electron and ion microscopy and microanalysis : principles and applications 2nd ed., rev. and expanded

Electron and ion microscopy and microanalysis : principles and applications

2nd ed., rev. and expanded

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Material Type: 図書
ISBN: 0824785568
Title: Electron and ion microscopy and microanalysis : principles and applications
Author/Editor: Lawrence E. Murr
Edition: 2nd ed., rev. and expanded
Author Heading: Murr, Lawrence Eugene
https://ci.nii.ac.jp/author/DA01483136
Publication, Distribution, etc.: M. Dekker
Publication Date: c1991
Publication Date (W3CDTF): 1991
Size: 27 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Electron microscopy
Field ion microscopy
Microprobe analysis
LCC: QH212.E4
Target Audience: 一般
Note (General): Includes bibliographical references and indexes
Related Material: Optical engineering
https://cir.nii.ac.jp/crid/1130282270484584320
Related Material (URI): https://ci.nii.ac.jp/ncid/BA13267539#entity
https://lccn.loc.gov/91020173
Periodical Title: Optical engineering
https://cir.nii.ac.jp/crid/1130282270484584320
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA13267539 : BA13267539
LC Control Number: 91020173
https://lccn.loc.gov/91020173