Diffraction and imaging techniques in material science set v. 1 v. 2 2d, rev. ed

Diffraction and imaging techniques in material science set

2d, rev. ed

Material type: 図書

Author: editors, S. Amelinckx, R. Gevers, J. Van Landuyt

Publisher: North-Holland : sole distributors for the U.S.A. and Canada, Elsevier North-Holland

Publication date: 1978

Material Format: Paper

Capacity, size, etc.: 23 cm

NDC: -

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Notes on use

Note (General)：: Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969,...

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Paper

Material Type: 図書
ISBN: 0444851305
0444851283
0444851291
Title: Diffraction and imaging techniques in material science
Volume: set
v. 1
v. 2
Author/Editor: editors, S. Amelinckx, R. Gevers, J. Van Landuyt
Edition: 2d, rev. ed
Author Heading: Amelinckx, Severin
https://ci.nii.ac.jp/author/DA02861760
Gevers, R.
https://ci.nii.ac.jp/author/DA05861279
Landuyt, J. van
https://ci.nii.ac.jp/author/DA05861326
International Summer Course on Material Science
https://ci.nii.ac.jp/author/DA05861337
Publication, Distribution, etc.: North-Holland : sole distributors for the U.S.A. and Canada, Elsevier North-Holland
Publication Date: 1978
Publication Date (W3CDTF): 1978
Size: 23 cm
Place of Publication (Country Code): ne
Text Language Code: en
Subject Heading: Electron microscopy -- Congresses
Electrons -- Diffraction -- Congresses
Imaging systems -- Congresses
LCC: TA417.23
Target Audience: 一般
Note (General): Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA02904572#entity
https://lccn.loc.gov/78022081
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA02904572 : BA02904572
LC Control Number: 78022081
https://lccn.loc.gov/78022081