2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

Author: sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

Notes on use

Note (General)：: At head of title: IEEE"IEEE Catalog No.: 05TH8799"--T.p. versoIncludes bibliographical references

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Material Type: 図書
ISBN: 0780389921
Title: 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
Author/Editor: sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
Author Heading: International Integrated Reliability Workshop
https://ci.nii.ac.jp/author/DA10253986
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
IEEE Reliability Society
https://ci.nii.ac.jp/author/DA03215295
Publication, Distribution, etc.: IEEE Electron Devices Society : IEEE Reliability Society
Publication Date: c2005
Publication Date (W3CDTF): 2005
Size: 28 cm
Alternative Title: IIRW 2005
05TH8799
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Reliability -- Congresses
Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
Target Audience: 一般
Note (General): At head of title: IEEE
"IEEE Catalog No.: 05TH8799"--T.p. verso
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA77792685#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA77792685 : BA77792685