ToF-SIMS : surface analysis by mass spectrometry

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Material Type: 図書
ISBN: 1901019039
Title: ToF-SIMS : surface analysis by mass spectrometry
Author/Editor: edited by John C. Vickerman and David Briggs
Author Heading: Vickerman, J. C.
https://ci.nii.ac.jp/author/DA04030772
Briggs, D.
https://ci.nii.ac.jp/author/DA00014537
Publication, Distribution, etc.: IM
Publication Date: c2001
Publication Date (W3CDTF): 2001
Size: 26 cm
Place of Publication (Country Code): uk
Text Language Code: en
Subject Heading: Surfaces (Technology) -- Analysis
Mass spectrometry
NDC 9th ed.: 431.86 : Physical and theoretical chemistry
Target Audience: 一般
Note (General): Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA78492213#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA78492213 : BA78492213