Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 U.S. Berlin

Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 U.S.

Material type: 図書

Author: editors: A.Benninghoven...[et al.]

Publisher: Springer-Verlag

Publication date: 1979

Material Format: Paper

Capacity, size, etc.: 24 cm

NDC: -

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Note (General)：: Includes bibliographies and index

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Springer series in chemical physics

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Paper

Material Type: 図書
ISBN: 0387098437
3540098437
Title: Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979
Volume: U.S.
Berlin
Author/Editor: editors: A.Benninghoven...[et al.]
Author Heading: International Conference on Secondary Ion Mass Spectrometry
https://ci.nii.ac.jp/author/DA01098292
Benninghoven, A.
https://ci.nii.ac.jp/author/DA01033322
Publication, Distribution, etc.: Springer-Verlag
Publication Date: 1979
Publication Date (W3CDTF): 1979
Size: 24 cm
Alternative Title: Proceedings of the International Conference(2nd, 1979)
Place of Publication (Country Code): gw
Text Language Code: en
Subject Heading: Secondary ion mass spectrometry -- Congresses
LCC: QD96.S43
Target Audience: 一般
Note (General): Includes bibliographies and index
Related Material: Springer series in chemical physics
https://cir.nii.ac.jp/crid/1130282269367598720
Related Material (URI): https://ci.nii.ac.jp/ncid/BA00565104#entity
https://lccn.loc.gov/79023997
Periodical Title: Springer series in chemical physics
https://cir.nii.ac.jp/crid/1130282269367598720
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA00565104 : BA00565104
LC Control Number: 79023997
https://lccn.loc.gov/79023997