Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

Material type: 図書

Author: editors, Osamu Ueda ... [et al.]

Publisher: Materials Research Society

Publication date: 2012

Material Format: Paper

Capacity, size, etc.: 24 cm

NDC: -

View All

Notes on use

Note (General)：: "Symposium G, 'Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II', was held April 9-13 a...

Related materials as well as pre- and post-revision versions

Materials Research Society symposium proceedings

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
Paper
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 9781605114095
Title: Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.
Author/Editor: editors, Osamu Ueda ... [et al.]
Author Heading: Ueda, Osamu
Materials Research Society
https://ci.nii.ac.jp/author/DA00024949
Materials Research Society. Spring Meeting
https://ci.nii.ac.jp/author/DA02961732
Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials
Publication, Distribution, etc.: Materials Research Society
Cambridge University Press
Publication Date: 2012
Publication Date (W3CDTF): 2012
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Materials -- Reliability -- Congresses
Semiconductors -- Materials -- Congresses
Microelectronics -- Reliability -- Congresses
Target Audience: 一般
Note (General): "Symposium G, 'Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II', was held April 9-13 at the 2012 MRS Spring Meeting in San Francisco, California."--Pref
Includes bibliographical references and indexes
Related Material: Materials Research Society symposium proceedings
https://cir.nii.ac.jp/crid/1130282268858574848
Related Material (URI): https://ci.nii.ac.jp/ncid/BB1037763X#entity
Periodical Title: Materials Research Society symposium proceedings
https://cir.nii.ac.jp/crid/1130282268858574848
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB1037763X : BB1037763X