Protocol test systems : proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989

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Material Type: 図書
ISBN: 0444885633
Title: Protocol test systems : proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989
Author/Editor: edited by Jan de Meer, Lothar Mackert, Wolfgang Effelsberg
Author Heading: IFIP TC6 International Workshop on Protocol Test Systems
https://ci.nii.ac.jp/author/DA05501080
Meer, Jan de
https://ci.nii.ac.jp/author/DA05501105
Mackert, Lothar
https://ci.nii.ac.jp/author/DA05501116
Effelsberg, Wolfgang
https://ci.nii.ac.jp/author/DA05501127
International Federation for Information Processing. Technical Committee
https://ci.nii.ac.jp/author/DA05501251
Publication, Distribution, etc.: North-Holland
Distributors for the U.S. and Canada, Elsevier Pub. Co.
Publication Date: 1990
Publication Date (W3CDTF): 1990
Size: 23 cm
Place of Publication (Country Code): ne
Text Language Code: en
Subject Heading: Computer networks protocols -- Testing -- Congresses
LCC: TK5105.5
Target Audience: 一般
Note (General): Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA11181443#entity
https://lccn.loc.gov/90006869
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA11181443 : BA11181443
LC Control Number: 90006869
https://lccn.loc.gov/90006869