ESEM '08 : proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software and Measurement : Kaiserslautern, Germany, Octocer 9-10, 2008

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Note (General)：: Includes bibliographical references and indexACM order number: 594087

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Material Type: 図書
ISBN: 9781595939715
Title: ESEM '08 : proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software and Measurement : Kaiserslautern, Germany, Octocer 9-10, 2008
Author/Editor: sponsored by ACM SigSoft and IEEE CS
Author Heading: International Symposium on Empirical Software and Measurement
ACM Sigsoft
https://ci.nii.ac.jp/author/DA00917784
IEEE Computer Society
https://ci.nii.ac.jp/author/DA00479199
Publication, Distribution, etc.: Association for Computing Machinery
Publication Date: c2008
Publication Date (W3CDTF): 2008
Size: 28cm
Alternative Title: ESEM '08 : proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software and Measurement : Octocer 9-10, 2008, Kaiserslautern, Germany
ESEM 2008
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Software engineering -- Congresses
LCC: QA76.758
Target Audience: 一般
Note (General): Includes bibliographical references and index
ACM order number: 594087
Related Material (URI): https://ci.nii.ac.jp/ncid/BA90520704#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA90520704 : BA90520704