Proceedings : Forty-second annual meeting : Electron Microscopy Society of America, Detroit, Michigan, 13-17 August 1984 : jointly with Microscopical Society of Canada Eleventh Annual Meeting

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Material Type: 図書
Title: Proceedings : Forty-second annual meeting : Electron Microscopy Society of America, Detroit, Michigan, 13-17 August 1984 : jointly with Microscopical Society of Canada Eleventh Annual Meeting
Author/Editor: Editor G.W. Bailey
Author Heading: Electron Microscopy Society of America
Bailey, G. W.
Annual Meeting Electron Microscopy Society of America
Publication, Distribution, etc.: San Francisco Press
Publication Date: 1984
Publication Date (W3CDTF): 1984
Size: 26 cm
Alternative Title: Electron Microscopy
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): ***記述は遡及データによる
Related Material (URI): https://ci.nii.ac.jp/ncid/BA62838181#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA62838181 : BA62838181