X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

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Note (General)：: Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National LaboratoryIncludes bibliographies and index

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Material Type: 図書
ISBN: 0387193928
3540193928
Title: X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
Author/Editor: D. Sayre ... [et al.] (eds.)
Author Heading: Sayre, David
https://ci.nii.ac.jp/author/DA0266751X
International Symposium on X-ray Microscopy
https://ci.nii.ac.jp/author/DA02733159
Publication, Distribution, etc.: Springer-Verlag
Publication Date: c1988
Publication Date (W3CDTF): 1988
Size: 24 cm
Place of Publication (Country Code): gw
Text Language Code: en
Subject Heading: X-ray microscope -- Congresses
LCC: QH212.X2
Target Audience: 一般
Note (General): Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory
Includes bibliographies and index
Related Material: Springer series in optical sciences
https://cir.nii.ac.jp/crid/1130000798006392960
Related Material (URI): https://ci.nii.ac.jp/ncid/BA04554427#entity
https://lccn.loc.gov/88020043
Periodical Title: Springer series in optical sciences
https://cir.nii.ac.jp/crid/1130000798006392960
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA04554427 : BA04554427
LC Control Number: 88020043
https://lccn.loc.gov/88020043