22nd annual proceedings : Reliability Physics 1984, Las Vegas, Nevada, April 3, 4, 5, 1984

Material type: 図書

Author: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Publisher: Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers

Publication date: c1984

Material Format: Paper

Capacity, size, etc.: 28 cm

NDC: -

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Notes on use

Note (General)：: "1984 International Reliability Physics Symposium"--T.p. versoGeneral chairman: G.H. Ebel"IEEE catalog no. 84CH1990-1."...

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Paper

Material Type: 図書
Title: 22nd annual proceedings : Reliability Physics 1984, Las Vegas, Nevada, April 3, 4, 5, 1984
Author/Editor: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
Author Heading: International Reliability Physics Symposium
https://ci.nii.ac.jp/author/DA11572276
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
IEEE Reliability Society
https://ci.nii.ac.jp/author/DA03215295
Publication, Distribution, etc.: Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers
Publication Date: c1984
Publication Date (W3CDTF): 1984
Size: 28 cm
Alternative Title: Reliability Physics, 22nd annual proceedings 1984
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Electronic apparatus and appliances -- Reliability Congresses
Electronic apparatus and appliances -- Testing Congresses
Integrated circuits -- Reliability Congresses
Integrated circuits -- Testing Congresses
Target Audience: 一般
Note (General): "1984 International Reliability Physics Symposium"--T.p. verso
General chairman: G.H. Ebel
"IEEE catalog no. 84CH1990-1."
"Library of Congress Catalog Card no. 82-640313."
"A bonus publication from your Reliability Society"--Cover
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA65964874#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA65964874 : BA65964874