2000 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 : softbound
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- Material Type
- 図書
- ISBN
- 0780363922
- Volume
- : softbound
- Author/Editor
- sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
- Author Heading
- Publication, Distribution, etc.
- Publication Date
- 1899c2000
- Publication Date (W3CDTF)
- 2000
- Size
- 28 cm