Hazard assessment and control technology in semiconductor manufacturing

Author: [sponsored by] American Conference of Governmental Industrial Hygienists

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Note (General)：: Papers presented at a symposium sponsored by the American Conference of Governmental Industrial Hygienists and others and held in Cincinnati, Ohio, Oc...

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Material Type: 図書
ISBN: 0873711327
Title: Hazard assessment and control technology in semiconductor manufacturing
Author/Editor: [sponsored by] American Conference of Governmental Industrial Hygienists
Author Heading: American Conference of Governmental Industrial Hygienists
https://ci.nii.ac.jp/author/DA02395690
Publication, Distribution, etc.: Lewis Publishers
Publication Date: c1989
Publication Date (W3CDTF): 1989
Size: 24 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Semiconductor industry -- Safety measures -- Congresses
LCC: TK7871.85
Target Audience: 一般
Note (General): Papers presented at a symposium sponsored by the American Conference of Governmental Industrial Hygienists and others and held in Cincinnati, Ohio, Oct. 20-22, 1987
Includes bibliographies and index
Related Material: Industrial hygiene science series
https://cir.nii.ac.jp/crid/1130282272492419968
Related Material (URI): https://ci.nii.ac.jp/ncid/BA11102618#entity
https://lccn.loc.gov/88037742
Periodical Title: Industrial hygiene science series
https://cir.nii.ac.jp/crid/1130282272492419968
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA11102618 : BA11102618
LC Control Number: 88037742
https://lccn.loc.gov/88037742