ISTFA '96 : proceedings of the 22nd International Symposium for Testing and Failure Analysis, 18-22 November 1996, Los Angeles, California

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Material Type: 図書
ISBN: 0871705826
Title: ISTFA '96 : proceedings of the 22nd International Symposium for Testing and Failure Analysis, 18-22 November 1996, Los Angeles, California
Author/Editor: sponsored by ASM International
Author Heading: International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.)
ASM International. Electronic Materials and Processing Division
Publication, Distribution, etc.: ASM International
Publication Date: c1996
Publication Date (W3CDTF): 1996
Size: 28 cm
Alternative Title: Proceedings of the 22nd International Symposium for Testing and Failure Analysis
Proceedings of the twenty-second International Symposium for Testing and Failure Analysis
22nd International Symposium for Testing and Failure Analysis
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Electronics -- Materials -- Testing -- Congresses
Electronic apparatus and appliances -- Testing -- Congresses
Target Audience: 一般
Note (General): Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BB09625472#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB09625472 : BB09625472