1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 :softbound

Author: sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

Notes on use

Note (General)：: "IEEE Catalog No. 97TH8319"--verso of T.pIncludes bibliographical references

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Material Type: 図書
ISBN: 0780342054
Title: 1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
Volume: :softbound
Author/Editor: sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
Author Heading: International Integrated Reliability Workshop
https://ci.nii.ac.jp/author/DA10253986
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
IEEE Reliability Society
https://ci.nii.ac.jp/author/DA03215295
Publication, Distribution, etc.: IEEE Electron Devices Society : IEEE Reliability Society
Publication Date: c1997
Publication Date (W3CDTF): 1997
Size: 28 cm
Alternative Title: 97TH8319
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Reliability -- Congresses
Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
LCC: TK7874
Target Audience: 一般
Note (General): "IEEE Catalog No. 97TH8319"--verso of T.p
Includes bibliographical references
Related Material (URI): https://ci.nii.ac.jp/ncid/BA48552666#entity
https://lccn.loc.gov/97080028
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA48552666 : BA48552666
LC Control Number: 97080028
https://lccn.loc.gov/97080028