ICMTS 95 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan/ sponsored by the IEEE Electron Devices Society : soft. : case. : micro.

ICMTS 95 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan/ sponsored by the IEEE Electron Devices Society : soft.

Material type: 図書

Author: IEEE International Conference on Microelectronic Test Structuresほか

Publisher: IEEE Service Center

Publication date: c1995

Material Format: Paper

Capacity, size, etc.: 28 cm

NDC: -

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Notes on use

Note (General)：: Includes bibliographical references and index

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Paper

Material Type: 図書
ISBN: 0780320654
0780320662
0780320670
Title: ICMTS 95 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan/ sponsored by the IEEE Electron Devices Society
Volume: : soft.
: case.
: micro.
Author Heading: IEEE International Conference on Microelectronic Test Structures
https://ci.nii.ac.jp/author/DA03840992
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
Publication, Distribution, etc.: IEEE Service Center
Publication Date: c1995
Publication Date (W3CDTF): 1995
Size: 28 cm
Alternative Title: 1995 IEEE International Conference on Microelectronic Test Structures
95CH34801
95CB34801
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Testing -- Congresses
LCC: TK7874
Target Audience: 一般
Note (General): Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA26058010#entity
https://lccn.loc.gov/94077700
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA26058010 : BA26058010
LC Control Number: 94077700
https://lccn.loc.gov/94077700