International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

Author: sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

Notes on use

Note (General)：: Title from cover"IEEE Catalog Number 02CH37382"--P. iiIncludes bibliographical references and index

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Material Type: 図書
ISBN: 0780375424
Title: International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
Author/Editor: sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
Author Heading: International Test Conference
https://ci.nii.ac.jp/author/DA0261156X
IEEE Computer Society. Test Technology Technical Council
https://ci.nii.ac.jp/author/DA1250352X
Institute of Electrical and Electronics Engineers. Philadelphia Section
https://ci.nii.ac.jp/author/DA02648490
Publication, Distribution, etc.: International Test Conference
Publication Date: c2002
Publication Date (W3CDTF): 2002
Size: 29 cm
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Integrated circuits -- Testing -- Congresses
Automatic checkout equipment -- Congresses
Target Audience: 一般
Note (General): Title from cover
"IEEE Catalog Number 02CH37382"--P. ii
Includes bibliographical references and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BA59306515#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA59306515 : BA59306515