Wiley series in quality and reliability engineering

Material type: 図書

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Publisher: John Wiley

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Material Format: Paper

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Integrated circuit failure analysis : a guide to preparation techniques Test engineering : a concise guide to cost-effective design, development, and manufacture Design for excellence in electronics manufacturing Electronic component reliability : fundamentals, modelling, evaluation, and assurance Measurement and calibration requirements for quality assurance to ISO 9000 Reliability and risk models setting reliability requirements Effective FMEAs : achieving safe, reliable, and economical products and processes using failure mode and effects analysis Improving product reliability : strategies and implementation Accelerated reliability engineering : HALT and HASS Practical applications of Bayesian reliability Design for maintainability Next generation HALT and HASS : robust design of electronics and systems Lead-free soldering process development and reliability

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Paper

Material Type: 図書
Title: Wiley series in quality and reliability engineering
Publication, Distribution, etc.: John Wiley
Place of Publication (Country Code): uk
Target Audience: 一般
Related Material: Integrated circuit failure analysis : a guide to preparation techniques
https://cir.nii.ac.jp/crid/1130000796594913152
Test engineering : a concise guide to cost-effective design, development, and manufacture
https://cir.nii.ac.jp/crid/1130000797614479232
Design for excellence in electronics manufacturing
https://cir.nii.ac.jp/crid/1130009283274151703
Electronic component reliability : fundamentals, modelling, evaluation, and assurance
https://cir.nii.ac.jp/crid/1130282268944302848
Measurement and calibration requirements for quality assurance to ISO 9000
https://cir.nii.ac.jp/crid/1130282269611047168
Reliability and risk models setting reliability requirements
https://cir.nii.ac.jp/crid/1130282270701240576
Effective FMEAs : achieving safe, reliable, and economical products and processes using failure mode and effects analysis
https://cir.nii.ac.jp/crid/1130282270734090240
Improving product reliability : strategies and implementation
https://cir.nii.ac.jp/crid/1130282272596419072
Accelerated reliability engineering : HALT and HASS
https://cir.nii.ac.jp/crid/1130282272968900736
Practical applications of Bayesian reliability
https://cir.nii.ac.jp/crid/1130285378552124032
Design for maintainability
https://cir.nii.ac.jp/crid/1130288513185646605
Next generation HALT and HASS : robust design of electronics and systems
https://cir.nii.ac.jp/crid/1130848326468549760
Lead-free soldering process development and reliability
https://cir.nii.ac.jp/crid/1130860598108429985
Related Material (URI): https://ci.nii.ac.jp/ncid/BA27800930#entity
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BA27800930 : BA27800930