世界半導体製造装置・試験/検査装置市場年鑑 2021 (LSI database)

世界半導体製造装置・試験/検査装置市場年鑑 = Semiconductor equipment test/inspection worldwide annual. 2021

(LSI database)

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Material Type: 図書
ISBN: 978-4-910417-13-4
Title: 世界半導体製造装置・試験/検査装置市場年鑑
Title Transcription: セカイハンドウタイセイゾウソウチ・シケン / ケンサソウチシジョウネンカン
Volume: 2021
Series Title: LSI database
Publication, Distribution, etc.: 東京 : グローバルネット (出版)
Publication Date: 2021.10
Publication Date (W3CDTF): 2021
Extent: 975 p
Size: 28 cm
Alternative Title: Semiconductor equipment test/inspection worldwide annual Semiconductor equipment test / inspection worldwide annual
Semiconductor equipment test/inspection worldwide annual
Place of Publication (Country Code): JP
Text Language Code: jpn
Content Type: テキスト
Media Type: 機器不用
Carrier Type: 冊子
Subject Heading: 半導体製造装置製造業ハンドウタイセイゾウソウチセイゾウギョウ ( 001237270 )Authorities
NDC 10th ed.: 549.8093 : Electronic engineering
NDLC: DL475
Target Audience: 一般
Price: 88000円
Holding library: 国立国会図書館
Call No.: DL475-R37
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 032397167
http://id.ndl.go.jp/bib/032397167
National Bibliography No. (JPNO): 24029120
Cataloging Rule: Nippon Cataloging Rules 2018 Edition
Bibliographic Record Category (NDL): 111