Proceedings : ATFA-78 : advanced techniques in failure analysis, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California USA : proceedings

Author: sponsored by the Institute of Electrical and Electronics Engineers, Inc., (IEEE) Los Angeles Council, Region 6

Notes on use

Note (General)：: "IEEE catalog no. 78CH1407-6 Reg. 6."Includes bibliographies and index

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Material Type: 図書
Title: Proceedings : ATFA-78 : advanced techniques in failure analysis, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California USA : proceedings
Author/Editor: sponsored by the Institute of Electrical and Electronics Engineers, Inc., (IEEE) Los Angeles Council, Region 6
Author Heading: Institute of Electrical and Electronics Engineers
https://ci.nii.ac.jp/author/DA00739948
Institute of Electrical and Electronics Engineers. Los Angeles Council
https://ci.nii.ac.jp/author/DA02617023
Publication, Distribution, etc.: Institute of Electrical and Electronics Engineers
Publication Date: c1978
Publication Date (W3CDTF): 1978
Size: 29 cm
Alternative Title: AFTA 78
ATFA-78 : advanced techniques in failure analysis
78CH1407-6 Reg6
78CH14076
Place of Publication (Country Code): us
Text Language Code: en
Subject Heading: Electronic apparatus and appliances -- Testing -- Congresses
Semiconductors -- Testing -- Congresses
LCC: TK7870.2
Target Audience: 一般
Note (General): "IEEE catalog no. 78CH1407-6 Reg. 6."
Includes bibliographies and index
Related Material (URI): https://ci.nii.ac.jp/ncid/BC02536815#entity
https://lccn.loc.gov/81184947
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BC02536815 : BC02536815
LC Control Number: 81184947
https://lccn.loc.gov/81184947