Next generation HALT and HASS : robust design of electronics and systems : cloth

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Material Type: 図書
ISBN: 9781118700235
Title: Next generation HALT and HASS : robust design of electronics and systems
Volume: : cloth
Author/Editor: Kirk A. Gray, John J. Paschkewitz
Author Heading: Gray, Kirk A.
Paschkewitz, John James
Publication, Distribution, etc.: Wiley
Publication Date: 2016
Publication Date (W3CDTF): 2016
Size: 24 cm
Place of Publication (Country Code): uk
Text Language Code: en
Subject Heading: Accelerated life testing
Electronic systems -- Design and construction
Electronic systems -- Testing
LCC: TA169.3
Target Audience: 一般
Note (General): Includes bibliographical references and index
Related Material: Wiley series in quality and reliability engineering
https://cir.nii.ac.jp/crid/1130282273346097920
Related Material (URI): https://ci.nii.ac.jp/ncid/BB2987161X#entity
https://lccn.loc.gov/2015044935
Periodical Title: Wiley series in quality and reliability engineering
https://cir.nii.ac.jp/crid/1130282273346097920
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BB2987161X : BB2987161X
LC Control Number: 2015044935
https://lccn.loc.gov/2015044935