15th annual proceedings, reliability physics 1977 : Las Vegas, Nevada, April 12-14, 1977

Author: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Group

Publisher: Electron Devices Society and reloability Group of the Institute of Electrical and Electronics Engineers

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Material Type: 図書
Title: 15th annual proceedings, reliability physics 1977 : Las Vegas, Nevada, April 12-14, 1977
Author/Editor: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Group
Author Heading: International Reliability Physics Symposium
https://ci.nii.ac.jp/author/DA11572276
IEEE Electron Devices Society
https://ci.nii.ac.jp/author/DA01257512
IEEE Reliability Society
https://ci.nii.ac.jp/author/DA03215295
Publication, Distribution, etc.: Electron Devices Society and reloability Group of the Institute of Electrical and Electronics Engineers
Publication Date: 1977
Publication Date (W3CDTF): 1977
Size: 28 cm
Alternative Title: IEEE 1977 Reliability Physics Symposium
77CH1195-7 PHY
VT:77CH11957
Place of Publication (Country Code): us
Text Language Code: en
Target Audience: 一般
Note (General): Includes bibliographies
"IEEE Catalog No. 77CH1195-7PHY"
Related Material (URI): https://ci.nii.ac.jp/ncid/BC02315623#entity
https://lccn.loc.gov/76180194
Data Provider (Database): 国立情報学研究所 : CiNii Research
Original Data Provider (Database): CiNii Books
https://ci.nii.ac.jp/books
NCID: https://ci.nii.ac.jp/ncid/BC02315623 : BC02315623
LC Control Number: 76180194
https://lccn.loc.gov/76180194