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Why in situ, real-time characterization of thin film growth processes ANL/CHM/PC-87054 DE95 015861

Why in situ, real-time characterization of thin film growth processes ANL/CHM/PC-87054 DE95 015861
Microform規格・テクニカルリポート類
Auciello, O, Krauss, A. R1995<LS-DE95/015861>
National Diet Library

Investigation of optical loss mechanisms in oxide thin films CONF-9503144-2 DE95 014270

Investigation of optical loss mechanisms in oxide thin films CONF-9503144-2 DE95 014270
PaperMicroform規格・テクニカルリポート類
Chow, A. F, Kingon, A. I, Auciello, O, Poker, D. B1995<LS-DE95/014270>
National Diet LibraryOther Libraries in Japan

Studies of ferroelectric heterostructure thin films and interfaces via in situ analytical techniques (ANL ; ANL/MSD/CP-99947)

Studies of ferroelectric heterostructure thin films and interfaces via in situ analytical techniques (ANL ; ANL/MSD/CP-99947)
Paper図書
O. Auciello [et al.]Argonne National Lab.1999.8.
Other Libraries in Japan
  • Author HeadingAuciello, O. Dhote, A. Gao, Y. Gruen, D.M....

WHY IN SITU, REAL-TIME CHARACTERIZATION OF THIN FILM GROWTH PROCESSES? (ANL ; ANL/CHM/PC-87054)

WHY IN SITU, REAL-TIME CHARACTERIZATION OF THIN FILM GROWTH PROCESSES? (ANL ; ANL/CHM/PC-87054)
Paper図書
AUCIELLO, O.// KRAUSS, A.R. (ARGONNE NATIONAL LAB., IL (UNITED STATES))Argonne National Laboratory(Argonne National Laboratory)1995.
Other Libraries in Japan
  • Author HeadingAUCIELLO, O. KRAUSS, A.R.

TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS AS A MEANS OF IN SITU, REAL-TIME CHARACTERIZATION OF THE GROWTH OF FERRO-ELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES (ANL ; ANL/CHM/CP-81275)

TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS AS A MEANS OF IN SITU, REAL-TIME CHARACTERIZATION OF THE GROWTH OF FERRO-ELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES (ANL ; ANL/CHM/CP-81275)
Paper図書
KRAUSS, A.R.// GRUEN, D.M.// AUCIELLO, O.// LIN, Y.// CHANG, R.P.H. (ARGONNE NATIONAL LAB., IL (UNITED STATES))Argonne National Laboratory(Argonne National Laboratory)1994.
Other Libraries in Japan
  • Author HeadingKRAUSS, A.R. GRUEN, D.M. AUCIELLO, O. LIN, Y. CHANG, R.P.H.

In situ, real-time analysis of the growth of ferroelectric and conductive oxide heterostructures by a new time-of-flight pulsed ion beam surface analysis technique (ANL ; ANL/CHM/CP-81247)

In situ, real-time analysis of the growth of ferroelectric and conductive oxide heterostructures by a new time-of-flight pulsed ion beam surface analysis technique (ANL ; ANL/CHM/CP-81247)
Paper図書
O. Auciello [et al.]Argonne National Lab.1994.6.
Other Libraries in Japan
  • Author HeadingAuciello, O. Krauss, A.R. Gruen, D.M. Lin,...

COMPUTER SIMULATION OF SCATTERED ION AND SPUTTERED SPECIES EFFECTS IN ION BEAM SPUTTER-DEPOSITION OF HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS (ANL ; ANL/CP-76122)

COMPUTER SIMULATION OF SCATTERED ION AND SPUTTERED SPECIES EFFECTS IN ION BEAM SPUTTER-DEPOSITION OF HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS (ANL ; ANL/CP-76122)
Paper図書
KRAUSS, A.R.// AUCIELLO, O. (ARGONNE NATIONAL LAB., IL (UNITED STATES))Argonne National Laboratory(Argonne National Laboratory)1992.
Other Libraries in Japan
  • Author HeadingKRAUSS, A.R. AUCIELLO, O.

STUDIES ON ION SCATTERING AND SPUTTERING PROCESSES RELEVANT TO ION BEAM SPUTTER DEPOSITION OF MULTICOMPONENT THIN FILMS (CONF ; CONF-891119-123)

STUDIES ON ION SCATTERING AND SPUTTERING PROCESSES RELEVANT TO ION BEAM SPUTTER DEPOSITION OF MULTICOMPONENT THIN FILMS (CONF ; CONF-891119-123)
Paper図書
AUCIELLO, O.(et al.)1989.
Other Libraries in Japan
  • Author HeadingAUCIELLO, O.

PULSED ION BEAM SURFACE ANALYSIS (PIBSA) AS A MEANS OF IN-SITU REALTIME ANALYSIS OF THIN FILMS DURING GROWTH (ANL ; ANL/CHM/CP-80915)

PULSED ION BEAM SURFACE ANALYSIS (PIBSA) AS A MEANS OF IN-SITU REALTIME ANALYSIS OF THIN FILMS DURING GROWTH (ANL ; ANL/CHM/CP-80915)
Paper図書
KRAUSS, A.R.// LAMICH, G.J.// GRUEN, D.M.// LIN, Y.// CHANG, R.P.H.// AUCIELLO, O.// SCHULTZ, J.A. (ARGONNE NATIONAL LAB., IL (UNITED STATES))Argonne National Laboratory(Argonne National Laboratory)1993.
Other Libraries in Japan
  • Author HeadingKRAUSS, A.R. LAMICH, G.J. GRUEN, D.M. LIN, Y. CHANG, R.P.H. AUCIELLO, O. SCHULTZ, J.A.

NOVEL METHOD FOR SPUTTER-DEPOSITION OF HIGH T/SUB C/ SUPERCONDUCTOR FILMS VIA A COMPUTER-CONTROLLED MASS ANALYZED ION BEAM. (CONF ; CONF-871125-21)

NOVEL METHOD FOR SPUTTER-DEPOSITION OF HIGH T/SUB C/ SUPERCONDUCTOR FILMS VIA A COMPUTER-CONTROLLED MASS ANALYZED ION BEAM. (CONF ; CONF-871125-21)
Paper図書
AUCIELLO, O.(et al.)1987.
Other Libraries in Japan
  • Author HeadingAUCIELLO, O.

REVIEW OF BASIC PHENOMENA AND TECHNIQUES FOR SPUTTER-DEPOSITION OF HIGH TEMPERATURE SUPERCONDUCTING FILMS (CONF ; CONF-9011108-1)

REVIEW OF BASIC PHENOMENA AND TECHNIQUES FOR SPUTTER-DEPOSITION OF HIGH TEMPERATURE SUPERCONDUCTING FILMS (CONF ; CONF-9011108-1)
Paper図書
AUCIELLO, O.// AMEEN, M.S.// KINGON, A.I.// LICHTENWALNER, D.J.// KRAUSS, A.R.(ARGONNE NATIONAL LAB., IL (USA))1990.
Other Libraries in Japan
  • Author HeadingAUCIELLO, O. AMEEN, M.S. KINGON, A.I. LICH...

COMPUTER-CONTROLLED ION BEAM DEPOSITION SYSTEMS FOR HIGH T/SUB C/ SUPERCONDUCTOR AND OTHER MULTI-COMPONENT OXIDE THIN FILMS AND LAYERED STRUCTURES (CONF ; CONF-900577-3)

COMPUTER-CONTROLLED ION BEAM DEPOSITION SYSTEMS FOR HIGH T/SUB C/ SUPERCONDUCTOR AND OTHER MULTI-COMPONENT OXIDE THIN FILMS AND LAYERED STRUCTURES (CONF ; CONF-900577-3)
Paper図書
KRAUSS, A.R.// GRUEN, D.M.// AUCIELLO, O.// KINGON, A.I.// AMEEN, M.S.// GRAETTINGER, T.M.// ROU, C.S.// SOBLE, C.S.// LIU, Y.L.// BARR, T. (ARGONNE NATIONAL LAB., IL (USA))1990.
Other Libraries in Japan
  • Author HeadingKRAUSS, A.R. GRUEN, D.M. AUCIELLO, O. KINGON, A.I. AMEEN, M.S. GRAE...

Atmosphere influence on in situ ion beam analysis of thin film growth ANL/CHM/CP-81118 DE95 001507 CONF-9404406

Atmosphere influence on in situ ion beam analysis of thin film growth ANL/CHM/CP-81118 DE95 001507 CONF-9404406
Microform規格・テクニカルリポート類
Lin, Y, Krauss, A. R, Gruen, D. M, Chang, R. P. H, Auciello, O. H1994<LS-DE95/001507>
National Diet Library

Ion bombardment modification of surfaces; Fundamentals and applications. (Beam modification of materials, 1)

Ion bombardment modification of surfaces; Fundamentals and applications. (Beam modification of materials, 1)
Paper図書
Auciello, O.(ed.)/Kelly, R.(ed.)Elsevier1984.
Other Libraries in Japan
  • Author HeadingAuciello, O. Kelly, R.

Review of synergisms in materials erosion due to multispecies impact (CFFTP ; CFFTP-G-85041) (UTIAS ; UTIAS-47)

Review of synergisms in materials erosion due to multispecies impact (CFFTP ; CFFTP-G-85041) (UTIAS ; UTIAS-47)
Paper図書
Haasz, A.A., Auciello, O., Stangeby, P.C.Canadian Fusion Fuels Technology Project1985.5.
Other Libraries in Japan
  • Author HeadingHaasz, A.A. Auciello, O. Stangeby, P.C.

Study of low-Z coatings for JET under exposure to electrons, laser radiation and atomic hydrogen (UTIAS ; UTIAS-303)

Study of low-Z coatings for JET under exposure to electrons, laser radiation and atomic hydrogen (UTIAS ; UTIAS-303)
Paper図書
Haasz, A.A. [et al.]Toronto Univ.1986.2.
Other Libraries in Japan
  • Author HeadingHaasz, A.A. Davis, J.W. Auciello, O. Stangeby, P.C.

Study of low-Z coatings for JET under exposure to electrons, laser radiation and atomic hydrogen (CFFTP ; CFFTP-G-85040)

Study of low-Z coatings for JET under exposure to electrons, laser radiation and atomic hydrogen (CFFTP ; CFFTP-G-85040)
Paper図書
Haasz, A.A. [et al.]Canadian Fusion Fuels Technology Project1985.5.
Other Libraries in Japan
  • Author HeadingHaasz, A.A. Davis, J.W. Auciello, O. Stangeby, P.C.

TRAPPING OF SUB-EV HYDROGEN AND DEUTERIUM ATOMS IN CARBON (CONF ; CONF-830942-11)

TRAPPING OF SUB-EV HYDROGEN AND DEUTERIUM ATOMS IN CARBON (CONF ; CONF-830942-11)
Paper図書
1983.
Other Libraries in Japan

IN SITU ANALYSIS OF THIN FILM DEPOSITION PROCESSES USING TIME-OF-FLIGHT (TOF) ION BEAM ANALYSIS METHODS (ANL ; ANL/CHM/CP-85678)

IN SITU ANALYSIS OF THIN FILM DEPOSITION PROCESSES USING TIME-OF-FLIGHT (TOF) ION BEAM ANALYSIS METHODS (ANL ; ANL/CHM/CP-85678)
Paper図書
IM, J.// KRAUSS, A.R.// GRUEN, D.M.// LIN, Y.// SCHULTZ, J.A.// AUCIELLO, O.H. (ARGONNE NATIONAL LAB., IL (UNITED STATES))Argonne National Laboratory(Argonne National Laboratory)1995.
Other Libraries in Japan
  • Author HeadingIM, J. KRAUSS, A.R. GRUEN, D.M. LIN, Y. SCHULTZ, J.A. AUCIELLO, O.H.

ATMOSPHERE INFLUENCE ON IN SITU ION BEAM ANALYSIS OF THIN FILM GROWTH (ANL ; ANL/CHM/CP-81118)

ATMOSPHERE INFLUENCE ON IN SITU ION BEAM ANALYSIS OF THIN FILM GROWTH (ANL ; ANL/CHM/CP-81118)
Paper図書
LIN, YUPING// KRAUSS, A.R.// GRUEN, D.M.// CHANG, R.P.H.// AUCIELLO, O.H.// SCHULTZ, J.A. (ARGONNE NATIONAL LAB., IL (UNITED STATES))Argonne National Laboratory(Argonne National Laboratory)1994.
Other Libraries in Japan
  • Author HeadingLIN, YUPING KRAUSS, A.R. GRUEN, D.M. CHANG, R.P.H. AUCIELLO, O.H. SCHULTZ, J.A.

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