Why in situ, real-time characterization of thin film growth processes ANL/CHM/PC-87054 DE95 015861

Why in situ, real-time characterization of thin film growth processes

ANL/CHM/PC-87054 DE95 015861

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Material Type: 規格・テクニカルリポート類
Title: Why in situ, real-time characterization of thin film growth processes
Author/Editor: Auciello, O
Krauss, A. R
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 5 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/CHM/PC-87054
テクニカルリポート番号 : DE95 015861
Holding library: 国立国会図書館
Call No.: LS-DE95/015861
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005538386
http://id.ndl.go.jp/bib/000005538386
Bibliographic Record Category (NDL): 291