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Advances in metrology for x-ray and EUV optics V : 18 August 2014 : San Diego, California, United States : Aug 2014, San Diego, CA. (SPIE Proceedings ; 9206)

Paper図書

SPIE[2014]<M17-15-236>

National Diet Library

Author HeadingAssoufid, Lahsen. Ohashi, Haruhiko. Asundi, An...

Advances in metrology for x-ray and EUV optics 4 : 12 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8501)

Paper図書

SPIEc2012.<M17-13-1006>

National Diet Library

Author HeadingAssoufid, Lahsen. Takacs, Peter Z. Asundi, Ana...

Advances in metrology for x-ray and EUV optics 2 : 30 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6704)

Paper図書

SPIEc2007.<M17-08-306>

National Diet Library

Author HeadingAssoufid, Lahsen. Takacs, Peter Z. Ohtsuka, Ma...

Advances in metrology for x-ray and EUV optics : 2-3 August 2005 : San Diego, California, USA. : Aug 2005, San Diego, CA. (SPIE Proceedings ; 5921)

Paper図書

SPIEc2005.<M17-06-225>

National Diet Library

Author HeadingAssoufid, Lahsen. Takacs, Peter Z. Taylor, J. ...

Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA

Paper図書

Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2007

Other Libraries in Japan

Author HeadingAssoufid, Lahsen Takacs, Peter Z. Ohtsuka, Mas...

Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA

Paper図書

Lahsen Assoufid, Peter Z. Takacs, John S. Taylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2005

Other Libraries in Japan

Author HeadingAssoufid, Lahsen Takacs, Peter Z. Taylor, J. S...

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