Advances in metrology for x-ray and EUV optics 2 : 30 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6704)

Advances in metrology for x-ray and EUV optics 2 : 30 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA.

(SPIE Proceedings ; 6704)

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Material Type: 図書
ISBN: 9780819468529
ISSN (series): 0277-786X
Title: Advances in metrology for x-ray and EUV optics 2 : 30 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA.
Series Title: SPIE Proceedings ; 6704
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 6704.
Author Heading: Assoufid, Lahsen.
Takacs, Peter Z.
Ohtsuka, Masaru.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: 1 v. (various pagings) : ill. (some col.) ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optical measurements -- Congresses.
Optical instruments -- Design and construction -- Congresses.
Measuring instruments -- Design and construction -- Congresses.
Laser interferometers -- Congresses.
Measurement -- Congresses.
LCC: QC367
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-08-306
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009215256
http://id.ndl.go.jp/bib/000009215256
OCLC No.: 182860020
https://www.worldcat.org/oclc/182860020
Bibliographic Record Category (NDL): 215