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Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry [microform] / W. Murray Bullis, S. Perkowitz, D.G. Seiler (NIST special publication ; 400-98) (Semiconductor measurement technology)
Microform図書
1995<YCA-C 13.10:400-98>
National Diet Library
  • Author HeadingBullis, W. Murray, 1930- Perkowitz, S Seiler, David G ...

Semiconductor measurement technology [microform] : evolution of silicon materials characterization : lessons learned for improved manufacturing / W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology" (NIST special publication ; 400-92)

Semiconductor measurement technology [microform] : evolution of silicon materials characterization : lessons learned for improved manufacturing / W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology" (NIST special publication ; 400-92)
Microform図書
1993<YCA-C 13.10:400-92>
National Diet Library
  • Author HeadingBullis, W. Murray, 1930- National Institute of Standar...

VLSI science and technology, 1985 : proceedings of the Third International Symposium on Very Large Scale Integration Science and Technology / edited by W.M. Bullis, S. Broydo ; assistant editors, J. Andrews ... [et al. ; sponsored by the] Electronics and Dielectrics and Insulation divisions. (Proceedings)

VLSI science and technology, 1985 : proceedings of the Third International Symposium on Very Large Scale Integration Science and Technology / edited by W.M. Bullis, S. Broydo ; assistant editors, J. Andrews ... [et al. ; sponsored by the] Electronics and Dielectrics and Insulation divisions. (Proceedings)
Paper図書
Electrochemical Societyc1985.<M15-A1399>
National Diet Library
  • Author Heading...Toronto, Ont.) Bullis, W. Murray, 1930- Broydo, S. Electrochemical So...

Proceedings of the Symposium on Defects in Silicon / edited by W. Murray Bullis, L.C. Kimerling ; assistant editors, J. Andrews ... [et al.]. (Proceedings)

Proceedings of the Symposium on Defects in Silicon / edited by W. Murray Bullis, L.C. Kimerling ; assistant editors, J. Andrews ... [et al.]. (Proceedings)
Paper図書
Electrochemical Societyc1983.<M15-A1760>
National Diet Library
  • Author Heading...San Francisco) Bullis, W. Murray, 1930- Kimerling, L. C. Electrochemi...

VLSI science and technology, 1982 : proceedings of the First International Symposium on Very Large Scale Integration Science and Technology / edited by Conrad J. Dell'Oca, W. Murray Bullis ; assistant editors, S. Broydo ... [et al. ; sponsored by] Electronics and Dielectrics and Insulation Divisions. (Proceedings)

VLSI science and technology, 1982 : proceedings of the First International Symposium on Very Large Scale Integration Science and Technology / edited by Conrad J. Dell'Oca, W. Murray Bullis ; assistant editors, S. Broydo ... [et al. ; sponsored by] Electronics and Dielectrics and Insulation Divisions. (Proceedings)
Paper図書
Electrochemical Societyc1982.<M15-A1368>
National Diet Library
  • Author Heading...Oca, Conrad J. Bullis, W. Murray, 1930- Electrochemical Society. Elec...

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