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ISTFA 2020 : papers planned for the 46th international symposium for testing and failure analysis : 2020, ------.

ISTFA 2020 : papers planned for the 46th international symposium for testing and failure analysis : 2020, ------.
Paper図書
ASM International[2020]<M17-22-500>
National Diet Library
  • Author HeadingElectronic Device Failure Analysis Society. ASM International.

ISTFA 2019 : conference proceedings from the 45th international symposium for testing and failure analysis : November 10-14, 2019 : Oregon Convention Center : Portland, Oregon USA : Nov 2019, Portland, OR.

ISTFA 2019 : conference proceedings from the 45th international symposium for testing and failure analysis : November 10-14, 2019 : Oregon Convention Center : Portland, Oregon USA : Nov 2019, Portland, OR.
Paper図書
ASM International[2019]<M17-22-260>
National Diet Library
  • Author Heading...Portland, Or.) Electronic Device Failure Analysis Society. ASM International.

ISTFA 2018 : conference proceedings from the 44th international symposium for testing and failure analysis : October 28-November 1, 2018 : Phoenix Convention Center : Phoenix, Arizona USA : Oct 2018, Phoenix, AZ.

ISTFA 2018 : conference proceedings from the 44th international symposium for testing and failure analysis : October 28-November 1, 2018 : Phoenix Convention Center : Phoenix, Arizona USA : Oct 2018, Phoenix, AZ.
Paper図書
ASM International[2018]<M17-22-261>
National Diet Library
  • Author Heading...enix, Arizona) Electronic Device Failure Analysis Society. ASM International.

ISTFA 2017 : conference proceedings from the 43rd international symposium for testing and failure analysis : November 5-9, 2017 : Pasadena Convention Center : Pasadena, California, USA : Nov 2017, Pasadena, CA.

ISTFA 2017 : conference proceedings from the 43rd international symposium for testing and failure analysis : November 5-9, 2017 : Pasadena Convention Center : Pasadena, California, USA : Nov 2017, Pasadena, CA.
Paper図書
ASM International[2017]<M17-19-1235>
National Diet Library
  • Author Heading...adena, Calif.) Electronic Device Failure Analysis Society. ASM International.

ISTFA 2016 : conference proceedings from the 42nd international symposium for testing and failure analysis : November 6-10, 2016 : Fort Worth Convention Center : Fort Worth, Texas, USA : Nov 2016, Fort Worth, TX.

ISTFA 2016 : conference proceedings from the 42nd international symposium for testing and failure analysis : November 6-10, 2016 : Fort Worth Convention Center : Fort Worth, Texas, USA : Nov 2016, Fort Worth, TX.
Paper図書
ASM International[2016]<M17-18-985>
National Diet Library
  • Author Heading...t Worth, Tex.) Electronic Device Failure Analysis Society. ASM International.

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis : November 1-5, 2015 : Oregon Convention Center : Portland, Oregon, USA : ISTFA 2015 conference & exposition : Nov 2015, Portland, OR.

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis : November 1-5, 2015 : Oregon Convention Center : Portland, Oregon, USA : ISTFA 2015 conference & exposition : Nov 2015, Portland, OR.
Paper図書
ASM International[2015]<M17-19-1179>
National Diet Library
  • Author Heading...Portland, Or.) Electronic Device Failure Analysis Society. ASM International.

ISTFA 2014 : conference proceedings from the 40th international symposium for testing and failure analysis : November 9-13, 2014 : George R. Brown Convention Center : Houston, Texas, USA : Nov 2014, Houston, TX.

ISTFA 2014 : conference proceedings from the 40th international symposium for testing and failure analysis : November 9-13, 2014 : George R. Brown Convention Center : Houston, Texas, USA : Nov 2014, Houston, TX.
Paper図書
ASM International[2014]<M17-15-3330>
National Diet Library
  • Author Heading...Houston, Tex.) Electronic Device Failure Analysis Society. ASM International.

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA : pbk

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA : pbk
Paper図書
ASM Internationalc2015
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis, November 9-13, 2014, George R. Brown Convention Center Houston, Texas, USA

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis, November 9-13, 2014, George R. Brown Convention Center Houston, Texas, USA
Paper図書
organized by EDFAS, ISTFA, ASM InternationalASM International2014
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San José McEnery Convention Center San José, California, USA

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San José McEnery Convention Center San José, California, USA
Paper図書
sponsored by EDFAS, ISTFA, ASM InternationalASM International2013
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA

ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA
Paper図書
sponsored by EDFAS, ISTFA, ASM InternationalASM Internationalc2007
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel Austin, Texas, USA

ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel Austin, Texas, USA
Paper図書
sponsored by EDFAS, ISTFA, ASM InternationalASM Internationalc2006
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2005 : proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center San Jose, California

ISTFA 2005 : proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center San Jose, California
Paper図書
sponsored by EDFAS, ISTFA, ASM InternationalASM Internationalc2005
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2004 : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts

ISTFA 2004 : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts
Paper図書
sponsored by EDFAS, ISTFA, ASM InternationalASM International2004
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.

ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.
Paper図書
sponsored by EDFAS, ISTFAASM International2002
Other Libraries in Japan
  • Author Heading... International Electronic Device Failure Analysis Society

Microelectronics failure analysis : desk reference 5th ed

Microelectronics failure analysis : desk reference 5th ed
Paper図書
edited by The Electronic Device Failure Analysis Society, Desk Reference CommitteeASM Internationalc2004
Other Libraries in Japan
  • Author HeadingElectronic Device Failure Analysis Society Desk Reference Committee

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