ISTFA 2017 : conference proceedings from the 43rd international symposium for testing and failure analysis : November 5-9, 2017 : Pasadena Convention Center : Pasadena, California, USA : Nov 2017, Pasadena, CA.

• Material Type: 図書
• ISBN: 9781627081504; 162708150X
• ISBN (error code): 978162708150X
• Title: ISTFA 2017 : conference proceedings from the 43rd international symposium for testing and failure analysis : November 5-9, 2017 : Pasadena Convention Center : Pasadena, California, USA : Nov 2017, Pasadena, CA.
• Author Heading: International Symposium for Testing and Failure Analysis (43rd : 2017 : Pasadena, Calif.); Electronic Device Failure Analysis Society.; ASM International.
• Publication, Distribution, etc.: Materials Park, Ohio : ASM International
• Publication Date: [2017]
• Publication Date (W3CDTF): 2017
• Extent: xix, 645 pages
• Other physical details: illustrations, charts
• Size: 28 cm
• Place of Publication (Country Code): US
• Text Language Code: eng
• Genre/Form Terms: Conference papers and proceedings.
• Content Type: txt : text
• Media Type: n : unmediated
• Carrier Type: nc : volume
• Subject Heading: Electronics--Materials--Testing--Congresses.; Electronic apparatus and appliances--Testing--Congresses.; Electronic apparatus and appliances--Testing.; Electronics--Materials--Testing.
• LCC: TK7871.85
• DDC: 621.381
• NDLC: M17
• Target Audience: 一般
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-19-1235
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 028989509; http://id.ndl.go.jp/bib/028989509
• OCLC No.: 1052613283; https://www.worldcat.org/oclc/1052613283
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 215