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Data analysis and modeling for process control 3 : 23 February 2006 : San Jose, California, USA. : Feb 2006, San Jose, CA. (SPIE Proceedings ; 6155)

Data analysis and modeling for process control 3 : 23 February 2006 : San Jose, California, USA. : Feb 2006, San Jose, CA. (SPIE Proceedings ; 6155)
Paper図書
SPIEc2006.<M17-06-1867>
National Diet Library
  • Author HeadingSEMATECH, Inc. Emami, Iraj. Tobin, Kenneth W.

Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003 : Santa Clara, California, USA. : Feb 2003, Santa Clara, CA. (SPIE Proceedings ; 5041)

Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003 : Santa Clara, California, USA. : Feb 2003, Santa Clara, CA. (SPIE Proceedings ; 5041)
Paper図書
SPIEc2003.<M17-04-489>
National Diet LibraryOther Libraries in Japan
  • Author HeadingTobin, Kenneth W. Emami, Iraj.

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA

Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA
Paper図書
Iraj Emami, Kenneth W. Tobin, Jr. ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEMATECH, IncSPIEc2006
Other Libraries in Japan
  • Author Heading...l (Conference) Emami, Iraj Tobin, Kenneth W. Internation...

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
Paper図書
Iraj Emami, chair/editor ; Christopher P. Ausschnitt, Kenneth W. Tobin, Jr., cochair/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, International SEMATECH ; published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan
  • Author Heading...l (Conference) Emami, Iraj Ausschnitt, Christopher P. To...

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